Metal-oxide-semiconductor capacitors on GaAs with high-k gate oxide and amorphous silicon interface passivation layer

By S. Koveshnikov, W. Tsai, I. Ok, J. Lee, V. Torkanov, M. Yakimov, S. Oktyabrsky. 2006

187 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/c879b88178cb1c8805a22ae42a16706a7fe4c055