Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

By I. Jung, M. Vaupel, M. Pelton, R. Piner, Dmitriy A. Dikin, S. Stankovich, J. An, Rodney S. Ruoff. 2008

226 citations recorded by the source corpus.

The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350−1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.

Subfields: Biomedical Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/c860e4ee9bb865477330c43f24b91f2cdc6bc7d3