Stacking fault related 3.31-eV luminescence at 130-meV acceptors in zinc oxide

By M. Schirra, R. Schneider, A. Reiser, G. Prinz, M. Feneberg, J. Biskupek, U. Kaiser, C. Krill, K. Thonke, R. Sauer. 2008

266 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/c823a927b7df4eed3120d40fe7468991f302b2f5