Depth analysis of subgap electronic states in amorphous oxide semiconductor, a-In-Ga-Zn-O, studied by hard x-ray photoelectron spectroscopy

By K. Nomura, T. Kamiya, E. Ikenaga, H. Yanagi, Keisuke L. I. Kobayashi, Hideo Hosono. 2011

162 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/c778122d7991bc8c4c7f2d51509df60b25e69ad3