A Compact Current–Voltage Model for 2D Semiconductor Based Field-Effect Transistors Considering Interface Traps, Mobility Degradation, and Inefficient Doping Effect

By Wei Cao, Jiahao Kang, Wei David Liu, Kaustav Banerjee. IEEE Transactions on Electron Devices, 2014

154 citations recorded by the source corpus.

Subfields: Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/c7249c9cd44e4bc5d2150eb741df62cc46765783