Transmission electron microscopy observation of deformation microstructure under spherical indentation in silicon

By J. Bradby, James S. Williams, J. Wong-Leung, M. Swain, P. Munroe. 2000

209 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/c70372bef2387ecaf39e9c4e2d740e34db2e3ea4