EVAL15: a diffraction data integration method based on ab initio predicted profiles

By A. Schreurs, X. Xian, L. Kroon-Batenburg. 2010

168 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Physical and Theoretical Chemistry

View Paper: https://www.semanticscholar.org/paper/c5739c587b72ae78622fd6cafa7d63b373ffa452

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electronic, Optical and Magnetic Materials

1. Paul D. Adams

In Materials Chemistry

1. James S. Fraser
2. Michael E. Wall
3. Paul D. Adams
4. G. Winter
5. R. Gildea
6. T. Michels-Clark
7. L. Fuentes-Montero
8. D. Waterman

In Physical and Theoretical Chemistry

1. Paul D. Adams
2. G. Winter

Citations in the corpus

• DIALS: implementation and evaluation of a new integration package (2018, background): “For chemical crystallography, SAINT (Bruker AXS Inc., Madison, Wisconsin, USA) and EVAL (Duisenberg et al., 2003; Schreurs et al., 2010) as well as d*TREK are in common use.”
• Meeting Review: Diffuse X-Ray Scattering to Model Protein Motions (2014, background): “…Elsevier Ltd All rights rese argued that diffuse scattering should be used to test TLS models, and Mark Wilson (Wilson, 2013) has noted that diffuse scattering could be used to develop and validate more detailed contact network (van den Bedem et al., 2013) or ensemble models (Burnley et al., 2012).”