Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material

By M. Schubert, J. Xi, Jong Kyu Kim, E. Fred Schubert. 2007

141 citations recorded by the source corpus.

A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/c4e398592608096152a711d0f726503242672432

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In Atomic and Molecular Physics, and Optics

1. A. González‐Elipe
2. Á. Barranco
3. A. Borrás
4. A. Palmero

In Electrical and Electronic Engineering

1. A. González‐Elipe
2. Á. Barranco
3. A. Borrás
4. A. Palmero

In Surfaces, Coatings and Films

1. A. González‐Elipe
2. Á. Barranco
3. A. Borrás
4. A. Palmero

Citations in the corpus

• Perspectives on oblique angle deposition of thin films: From fundamentals to devices (2016, background): “Other photonic components such as Bragg reflectors [316,332], broadband antireflective and conductive materials [331], and transparent electrodes and antireflection contacts in organic light emitting devices [330,333] have also incorporated similar photonic and conductive layers.”