Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy

By P. Wolf, R. Stephenson, T. Trenkler, T. Clarysse, T. Hantschel, W. Vandervorst. 2000

184 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/c42c77d5bd0db8134bde8549b1eb8504e3199219