Raman and XPS characterization of vanadium oxide thin films with temperature

By Ferran Ureña-Begara, A. Crunteanu, J. Raskin. 2017

323 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics

View Paper: https://www.semanticscholar.org/paper/c3f9c53c1547c0aa268b7ca107c50f03358f4a15