Rietveld texture analysis from TOF neutron diffraction data

By H. Wenk, Luca Lutterotti, Sven C. Vogel. Powder Diffraction, 2010

191 citations recorded by the source corpus.

Subfields: Geophysics, Materials Chemistry, Radiation

View Paper: https://www.semanticscholar.org/paper/c0e3641449fda456198baff05426eff8b6681e98

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Geophysics

1. Roman Vasin
2. Luca Lutterotti
3. H. Wenk
4. Ricardo A. Lebensohn
5. C. Tomé

In Materials Chemistry

1. Roman Vasin
2. H. Wenk
3. Luca Lutterotti

In Radiation

1. Roman Vasin
2. H. Wenk
3. Luca Lutterotti

Citations in the corpus

• Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis (2014, methodology): “…information from time-of-flight (TOF) neutron diffraction spectra and this has been applied to several instruments such as HIPPO at the Lujan Center of Los Alamos National Laboratory (Wenk et al., 2010) and SKAT at the Joint Institute for Nuclear Research in Dubna, Russia (Wenk et al., 2012).”