Lock-in thermography : basics and use for functional diagnostics of electronic components

By O. Breitenstein, M. Langenkamp. 2003

195 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/bf3beb7adfc7546164d42b5d030b708fa44ca3a2

Citations in the corpus

• On the detection of shunts in silicon solar cells by photo‐ and electroluminescence imaging (2008, unknown): “In Figure 3c the 08- (in-phase-) image of the DLIT measurement is shown, because in this image the shunts are visible with a higher spatial resolution than by the DLIT amplitude image.(10) These shunts are typical pre-breakdown sites.”