Nanoscale pore structure and mechanical property analysis of coal: An insight combining AFM and SEM images

By Yong Li, Jianghao Yang, Z. Pan, Wangshu Tong. 2020

345 citations recorded by the source corpus.

Abstract Scanning Electron Microscopy (SEM) and Atomic Force Microscope (AFM), two easily acquired and widely applied image acquisition and analysis methods, have rarely been combined to study the pore structure for unconventional natural gas reservoir rocks. In this work, we present an investigation of nanoscale detection of the pore distribution and mechanical properties of coals using SEM and AFM observations, and conduct quantitative analyses on pore structure distribution, surface roughness and mechanical properties. The morphological characteristics of the coal surface can be revealed by both SEM and AFM methods, and the mechanical parameters of the selected position were obtained under the peakforce quantitative nano-mechanics (PF-QNM) AFM mode, including the Young's modulus, peak force error, deformation, and adhesion forces. By fusing 800 high resolution SEM images into one single image (named as MAPS), the pores morphology and distribution of different scales were acquired. And the studied coal shows different types of cellular pores and gas pores with multiresolution. The mechanical property difference between the matrix and minerals of coal are clearly observed, with the Young’s modulus of organic component around 2 GPa, and that of the minerals generally higher than 10 GPa. The maximum adhesion force values range between 20 and 50 nN. The high values occurred where pores are developed. This work demonstrated that the combination of two dimensional (2D) SEM and three dimensional (3D) AFM results is effective in detection of surface properties, and is of significance in revealing the pore structure and mechanical properties at nanoscale.

Subfields: Mechanics of Materials, Ocean Engineering

View Paper: https://www.semanticscholar.org/paper/bedb7a5e867fa58e0a1d1c092c9dc9c9fc6b7e90

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. Jinlong Zhu
2. Jiamin Liu
3. Shiyuan Liu
4. Zexu Zhang
5. Tianlai Xu
6. Shuai Yuan
7. R. Zhou
8. Hao Jiang

Citations in the corpus

• Optical wafer defect inspection at the 10 nm technology node and beyond (2022, background): “Atomic force microscope (AFM) is a non-contact solution, but the challenges in the fabrication of probes to go down inside the sub-10 nm trench and the low inspection rate due to the scanning mode, hinders its application in defect inspection [13, 14].”