A case study of ir-drop in structured at-speed testing

By J. Saxena, K. Butler, Vinay B. Jayaram, Subhendu Kundu, N. Arvind, Pravin Sreeprakash, Manfred Hachinger. International Test Conference, 2003. Proceedings. ITC 2003., 2003

422 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/be903265c02e0416cfcf42781b071690fea541da

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. K. Butler
2. T. Fryars
3. G. Hetherington
4. J. Saxena

Citations in the corpus

• Minimizing power consumption in scan testing: pattern generation and DFT techniques (2004, background): “But, in recent technologies, at-speed test has become a requirement in order to maintain su(cid:14)cient levels of outgoing quality [1]{[8].”