Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry

By E. Schafler, G. Steiner, E. Korznikova, M. Kerber, Michael Zehetbauer. 2005

157 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/be207e50a231163e8167da6712eb77b7e6bdd162