Microwave dielectric loss at single photon energies and millikelvin temperatures
By A. O'Connell, M. Ansmann, R. Bialczak, M. Hofheinz, N. Katz, E. Lucero, C. Mckenney, Matthew Neeley, H. Wang, E. Weig and 2 more. 2008
285 citations recorded by the source corpus.
The microwave performance of amorphous dielectric materials at very low temperatures and very low excitation strengths displays significant excess loss. Here, we present the loss tangents of some common amorphous and crystalline dielectrics, measured at low temperatures (T<100mK) with near single-photon excitation energies, E∕ℏω0∼1, using both coplanar waveguide and lumped LC resonators. The loss can be understood using a two-level state defect model. A circuit analysis of the half-wavelength resonators we used is outlined, and the energy dissipation of such a resonator on a multilayered dielectric substrate is theoretically considered.
Subfields: Artificial Intelligence, Atomic and Molecular Physics, and Optics
View Paper: https://www.semanticscholar.org/paper/baf43e449fc5687835e07f71869f3650e24d88c2
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In Atomic and Molecular Physics, and Optics
Citations in the corpus
- Lumped Element Kinetic Inductance Detectors (2008, background): “Deposited dielectrics tend to have high loss tangents due to impurities in the deposition process and two-level systems [45,46].”