Characterization and parasitic extraction of EMI filters using scattering parameters
By Shuo Wang, F. C. Lee, Willem G. Odendaal. IEEE transactions on power electronics, 2005
155 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/ba15a4529036b3f566a7f5f006cd46899a3c0858
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In Electrical and Electronic Engineering
Citations in the corpus
- A Survey of EMI Research in Power Electronics Systems With Wide-Bandgap Semiconductor Devices (2020, background): “HF EMI noise could be difficult to reduce because EMI filters’ HF performance is limited by magnetic materials and filter’s parasitic parameters [26], [27].”