Silicon vacancy related defect in 4H and 6H SiC

By E. Sörman, N. T. Son, Weimin M. Chen, O. Kordina, C. Hallin, E. Janzén. 2000

205 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/b9966d10e51c90b325aa633c4f71ac65f0163e50