Robust fabric defect detection and classification using multiple adaptive wavelets

By Xuezhi Yang, Grantham Kwok-Hung Pang, Nelson Hong Ching Yung. 2005

108 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering, Media Technology

View Paper: https://www.semanticscholar.org/paper/b93131d2f10261b3da81734eb5cc7ba0b1fb4b1a