Value of Security: Modeling Time-Dependent Phenomena and Weather Conditions

By M. Rios, Daniel S. Kirschen, D. Jayaweera, Dusko P. Nedic, R. Allan. IEEE Power Engineering Review, 2002

259 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality

View Paper: https://www.semanticscholar.org/paper/b855114f45bf0cc237e1558208d7bce4e140e34a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

  1. Pierluigi Mancarella
  2. Mathaios Panteli
  3. Ian Dobson
  4. Benjamin A. Carreras
  5. David E. Newman
  6. Vickie E. Lynch
  7. Daniel S. Kirschen
  8. Narayan Bhusal

In Safety, Risk, Reliability and Quality

  1. Mathaios Panteli
  2. Pierluigi Mancarella
  3. Benjamin A. Carreras
  4. Ian Dobson
  5. Vickie E. Lynch
  6. Daniel S. Kirschen
  7. Dusko P. Nedic
  8. David E. Newman

Citations in the corpus