Length-scale-controlled fatigue mechanisms in thin copper films

By Guang-Ping Zhang, C. Volkert, R. Schwaiger, P. Wellner, Eduard Arzt, Oliver Kraft. 2006

185 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/b80d4f3cda218e9f44243e44f9dfc2d0520b71c9