Endurance/Retention Trade-off on $\hbox{HfO}_{2}/\hbox{Metal}$ Cap 1T1R Bipolar RRAM

By Yangyin Chen, L. Goux, S. Clima, B. Govoreanu, Robin Degraeve, G. S. Kar, A. Fantini, Guido Groeseneken, Dirk J. Wouters, Malgorzata Jurczak. IEEE Transactions on Electron Devices, 2013

176 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/b74a157b92bbe970384ed50d6afaae85135f5dff