Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminium oxide layers

By J. Brand, W. Sloof, Herman Terryn, J. Wit. 2004

169 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/b57b3c8e3fb80bee6d1ea298827fc861e06959c6