Z-Contrast tomography: a technique inthree-dimensional nanostructural analysis based on Rutherfordscattering

By P. Midgley, M. Weyland, John Meurig Thomas, B. Johnson. 2001

222 citations recorded by the source corpus.

Subfields: Materials Chemistry, Statistical and Nonlinear Physics, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/b4f8c1e32d979b6088daacfc2e29a6381151859f