Defect identification in semiconductors with positron annihilation: Experiment and theory

By F. Tuomisto, Ilja Makkonen. 2013

595 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Mechanics of Materials, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/b4cb6fef40e904c29628d31649b5573d045db605

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In Electrical and Electronic Engineering

1. Micael J. T. Oliveira

Citations in the corpus

• Recent developments in the ABINIT software package (2016, background): “These quantities, in turn, can be used to model two positron annihilation characteristics, the lifetime of a positron and the momentum distribution of annihilating electron–positron pairs (Doppler broadening), which are measured in positron annihilation spectroscopy (PAS) [29].”