On the distribution of the estimated process yield index Spk

By J. C. Lee, Hui-Nien Hung, Wen Lea Pearn, T. Kueng. 2002

98 citations recorded by the source corpus.

Subfields: Statistics and Probability

View Paper: https://www.semanticscholar.org/paper/b44894c4cfc5b359e2d2cc613f077cbf42c890d3

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In Statistics and Probability

1. Ya Ching Cheng
2. Wen Lea Pearn

Citations in the corpus

• Measuring production yield for processes with multiple characteristics (2010, background): “For example, Pearn et al. (1992) proposed the indices vCpm, vCp which require the assumption of multivariate normality and thus the tolerance region is ellipsoidal.”