Precision and accuracy of thermal calibration of atomic force microscopy cantilevers

By G. Matei, E. Thoreson, Jon R. Pratt, David B. Newell, N. Burnham. 2006

132 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/b3a114f69f313b75501554fdceb3f14de61d03eb