Automatic thresholding for defect detection
By Hui-Fuang Ng. International Conference on Image and Graphics, 2004
637 citations recorded by the source corpus.
Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering, Media Technology
View Paper: https://www.semanticscholar.org/paper/b2a80d74451e4d3d0e87600310878cbb403631cc
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Computer Vision and Pattern Recognition
- Luc Van Gool
- Dacheng Tao
- Trevor Darrell
- Xiaogang Wang
- Ming-Hsuan Yang
- Alan L. Yuille
- Andrew Zisserman
- Yi Yang
In Industrial and Manufacturing Engineering
- Mario Milazzo
- Paolo Dario
- Marcello Chiurazzi
- Tamás Czimmermann
- Calogero Maria Oddo
- Gastone Ciuti
- Stefano Roccella
- Ivan Popov
In Media Technology
Citations in the corpus
- Visual-Based Defect Detection and Classification Approaches for Industrial Applications—A SURVEY (2020, background): “Implementations can be found, for instance, in [6,7,143–145], which have proven to be worthy as low-level processes in defect detection.”
- Feature selection for surface defect classification of extruded aluminum profiles (2016, methodology): “Ng was not satisfied with the results provided by this method for small defects, so he modified it developing the valley-emphasis method [12].”
- A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques (2008, methodology): “Re cently, Ng [94] proposed a histogram separation technique based on the Otsu global thresholding method [100 ] to segment surface defects.”
- Augmentation for small object detection (2019, background): “Automatic industrial inspection can also benefit from small object detection by the localization of small defects that can be visible on the material surfaces [1,30].”