Automatic thresholding for defect detection

By Hui-Fuang Ng. International Conference on Image and Graphics, 2004

637 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering, Media Technology

View Paper: https://www.semanticscholar.org/paper/b2a80d74451e4d3d0e87600310878cbb403631cc

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Dacheng Tao
  3. Trevor Darrell
  4. Xiaogang Wang
  5. Ming-Hsuan Yang
  6. Alan L. Yuille
  7. Andrew Zisserman
  8. Yi Yang

In Industrial and Manufacturing Engineering

  1. Mario Milazzo
  2. Paolo Dario
  3. Marcello Chiurazzi
  4. Tamás Czimmermann
  5. Calogero Maria Oddo
  6. Gastone Ciuti
  7. Stefano Roccella
  8. Ivan Popov

In Media Technology

  1. Ivan Popov
  2. Kyunghyun Cho
  3. Xianghua Xie
  4. Ivan N. Jordanov
  5. Apostolos Chondronasios

Citations in the corpus