Practical estimation of measurement noise and flatness deviation on focus variation microscopes

By C. Giusca, J. Claverley, Wenjuan Sun, Richard Leach, F. Helmli, Mathieu P.J. Chavigner. 2014

54 citations recorded by the source corpus.

Subfields: Computational Mechanics, Computer Vision and Pattern Recognition, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/b18cf7f30ccb1116c90274bc310e5adf1e93515e