Document image defect models

By Henry S. Baird. 1995

Subfields: Computer Vision and Pattern Recognition

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Dacheng Tao
  3. Xiaogang Wang
  4. Ming-Hsuan Yang
  5. Trevor Darrell
  6. Jitendra Malik
  7. Andrea Vedaldi
  8. Andrew Zisserman

Citations in the corpus