High spatial resolution electron probe microanalysis of tephras and melt inclusions without beam-induced chemical modification

By C. Hayward. 2012

189 citations recorded by the source corpus.

Subfields: Computational Mechanics, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/b01cd62638c58dd22c2e9659d9bfa04d94ddbeb1