Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In–Ga–Zn–O Thin-Film Transistors

By Wei‐Tsung Chen, Shih-Yi Lo, Shih-Chin Kao, H. Zan, C. Tsai, Jian-Hong Lin, Chun-Hsiang Fang, Chung‐Chun Lee. IEEE Electron Device Letters, 2011

171 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/afb82bf337fda7036ca52e7d218b7e35d79ebce6