Origin of thickness dependent dc electrical breakdown in dielectrics

By George Chen, Junwei Zhao, Shengtao Li, L. Zhong. 2012

185 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/aeaa0f720d48f5b7a85679813eef2b7fa738c1a6