Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results

By K. Kaznatcheev, C. Karunakaran, U. Lanke, S. Urquhart, M. Obst, A. Hitchcock. 2007

247 citations recorded by the source corpus.

Subfields: Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/ae5606e7992dc5ca3c0035ab2b15571c9c89ea1e

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. N. Bassim
2. G. Cody
3. K. Scott
4. A. Kilcoyne
5. B. D. Gregorio
6. T. Chou
7. Sue Wirick
8. R. M. Stroud

Citations in the corpus

• Minimizing damage during FIB sample preparation of soft materials (2012, methodology): “Each of these beamlines is equipped with similar STXM instruments, and sample configurations and hardware details are described elsewhere (Jacobsen et al., 1991; Kilcoyne et al., 2003; Kaznatcheev et al., 2007).”