Goodness‐of‐fit Tests for GEE with Correlated Binary Data
By Wei Pan. 2002
71 citations recorded by the source corpus.
Subfields: Management Science and Operations Research, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/ae29fc97aeac0313cb41c5ba9633fdcfad5510c0
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In Management Science and Operations Research
- Lan Wang
- Annie Qu
- Bruce G. Lindsay
- Wing Kam Fung
- Zhongyi Zhu
- Xuming He
- Damian W. Betebenner
- Ying Wei
In Statistics and Probability
Citations in the corpus
- Consistent model selection and data‐driven smooth tests for longitudinal data in the estimating equations approach (2009, methodology): “We compare, via numerical simulations, the BIQIF with several alternative methods: the AIC and BIC procedures based on the full likelihood; the Z-test procedure; and the QIC procedure of Pan (2001). To reduce the computational burden, we use the true correlation matrix for computing AIC, BIC, and th”
- Inference Functions and Quadratic Score Tests (2003, methodology): “Noncentrality parameters for local alternatives are given in Newey and West (1987) and Qu, Lindsay and Li (2000). These latter are important for power and sample size calculations.”
- Robust Estimation in Generalized Partial Linear Models for Clustered Data (2005, methodology): “The responses yij are generated using a procedure of Pan (2002) such that the correlation within each cluster is ρ12 = ρ23 = .”
- GEE analysis of clustered binary data with diverging number of covariates (2011, background): “The derivation can be found in Pan (2002).”