Nanoelectromechanics of piezoresponse force microscopy
By Sergei V. Kalinin, E. Karapetian, M. G. C. M. S. Division, Oak Ridge National Laboratory, Oak Ridge, Tn, Department of MathematicsComputer Science Suffolk University, Boston, Ma., Medford. 2004
248 citations recorded by the source corpus.
To achieve quantitative interpretation of piezoresponse force microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside the material are derived for the cases of weak and strong indentation. In the weak indentation case, electrostatic field distribution is calculated using an image charge model. In the strong indentation case, the solution of the coupled electroelastic problem for piezoelectric indentation is used to obtain the electric field and strain distribution in the ferroelectric material. This establishes a complete continuum mechanics description of the PFM contact mechanics and imaging mechanism. The electroelastic field distribution allows signal generation volume in PFM to be determined. These rigorous solutions are compared with the electrostatic point-charge and sphere-plane models, and the applicability limits for asymptotic point-charge and point-force models are established. The implications of these results for ferroelectric polarization switching processes are analyzed.
Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/ad78371c67026a081f8a2e5f8e008c04bd07308b
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In Atomic and Molecular Physics, and Optics
Citations in the corpus
- Strain-based scanning probe microscopies for functional materials, biological structures, and electrochemical systems (2015, methodology): “In fact, analyses suggest that the relationship between the effective piezoelectric coefficients derived from PFM and the electromechanical moduli can be highly nonlinear, even when the constitutive behavior of the specimen is strictly linear [121,122].”
- Tip-enhanced photovoltaic effects in bismuth ferrite (2011, background): “Actually, it is drastically enhanced at the crystal surface below the tip and strongly confined there, as in the case of other AFM-based measurements such as PF”