Fast normalized cross correlation for defect detection

By Du-Ming Tsai, Chien-Ta Lin. Pattern Recognition Letters, 2003

326 citations recorded by the source corpus.

Subfields: Industrial and Manufacturing Engineering, Media Technology

View Paper: https://www.semanticscholar.org/paper/ad73cd418319510ad354d5fb51a63775929d91b5

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Industrial and Manufacturing Engineering

  1. Michael G. Pecht
  2. Jing Tian
  3. Michael H. Azarian
  4. Gim Hee Lee
  5. Carlos Morillo

In Media Technology

  1. Michael G. Pecht
  2. Marc Pollefeys
  3. Jing Tian
  4. Christian Häne
  5. Michael H. Azarian
  6. Gim Hee Lee
  7. Carlos Morillo

Citations in the corpus