Electrical characterization of thin Al2O3 films grown by atomic layer deposition on silicon and various metal substrates

By M. Groner, Jeffrey W. Elam, F. Fabreguette, S. George. 2002

653 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/aca6f8743cb6894e672fab5dfad9fbb4cb095c80

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In Electrical and Electronic Engineering

  1. Paul V. Braun

In Electronic, Optical and Magnetic Materials

  1. Paul V. Braun

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