XPS characterization of surface and interfacial structure of sputtered TiNi films on Si substrate

By Y. Fu, H. Du, Sam Zhang, Wenyi Huang. 2005

154 citations recorded by the source corpus.

Subfields: Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/ac2d9544d678d92e2ce7bc97641f21f6c57456c5