Defect detection in textured materials using Gabor filters

By Ajay Kumar, Grantham Kwok-Hung Pang. Conference Record of the 2000 IEEE Industry Applications Conference. Thirty-Fifth IAS Annual Meeting and World Conference on Industrial Applications of Electrical Energy (Cat. No.00CH37129), 2000

497 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Industrial and Manufacturing Engineering, Polymers and Plastics

View Paper: https://www.semanticscholar.org/paper/aa873bb67cc952f89116e29073e34484c1ef4ef5

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

  1. Xianghua Xie
  2. Anne Humeau-Heurtier
  3. Domingo Mery
  4. J. Urgen Schmidhuber
  5. Paolo Dario
  6. Ajay Kumar
  7. Stefano Roccella
  8. Marcus Hutter

In Industrial and Manufacturing Engineering

  1. J. Urgen Schmidhuber
  2. Mario Milazzo
  3. Paolo Dario
  4. Marcello Chiurazzi
  5. Tamás Czimmermann
  6. Calogero Maria Oddo
  7. Gastone Ciuti
  8. Stefano Roccella

In Polymers and Plastics

  1. Xianghua Xie
  2. Anne Humeau-Heurtier
  3. Ajay Kumar

Citations in the corpus