Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies
By Roger H. French, H. Müllejans, David J. Jones. 2005
185 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/aa41fd5a9b734f4b57f00aeb1f7ddf99de063f9b
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In Electrical and Electronic Engineering
In Electronic, Optical and Magnetic Materials
In Materials Chemistry
Citations in the corpus
- Optical excitations in electron microscopy (2009, methodology): “…(19) is commonly employed to perform Kramers-Kronig (KK) analysis and to retrieve bulk optical constants from measured EELS data after absolute calibration of the loss function Im{−1/ } (Egerton, 1996; French et al., 1998; Pflüger and Fink, 1991; Shiles et al., 1980; Zhang et al., 2008).”