Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping

By S. Pereira, M. Correia, E. Pereira, K. O'Donnell, E. Alves, A. Sequeira, N. Franco, I. Watson, C. J. Deatcher. 2002

221 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/a9c136c6106b6dfda8d2243ff50a7d3f3862233d

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In Condensed Matter Physics

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Citations in the corpus

• GIXSGUI: a MATLAB toolbox for grazing‐incidence X‐ray scattering data visualization and reduction, and indexing of buried three‐dimensional periodic nanostructured films (2015, methodology): “This problem can be solved by the technique of reciprocal space mapping (Pereira et al., 2002; Smilgies et al., 2005; Yoshida et al., 2007), which transforms a set of angular scans taken with slightly different offsets into a reconstructed twoor three-dimensional reciprocal space.”