Sensing electric fields using single diamond spins

By F. Dolde, H. Fedder, Marcus W. Doherty, T. Nobauer, F. Rempp, G. Balasubramanian, Thomas Wolf, F. Reinhard, Lloyd Christopher L. Hollenberg, Fedor Jelezko and 1 more. 2011

228 citations recorded by the source corpus.

The ability to sensitively detect charges under amb ient conditions would be a fascinating new tool benefitting a wide range of researchers ac ross disciplines. However, most current techniques are limited to low-temperature methods l ike single-electron transistors (SET)[1,2], single–electron electrostatic force microscopy[3] a nd scanning tunnelling microscopy [4]. Here we open up a new quantum metrology technique demons trating precision electric field measurement using a single nitrogen-vacancy defect entre(NV) spin in diamond. An AC electric field sensitivity reaching ~ 140V/cm/ √Hz has been achieved. This corresponds to the electric field produced by a single elementary char ge located at a distance of ~ 150 nm from our spin sensor with averaging for one second. By caref ul analysis of the electronic structure of the defect centre, we show how an applied magnetic fiel d influences the electric field sensing properties. By this we demonstrate that diamond defct centre spins can be switched between electric and magnetic field sensing modes and ident ify suitable parameter ranges for both detector schemes. By combining magnetic and electri c field sensitivity, nanoscale detection and ambient operation our study opens up new frontiers in imaging and sensing applications ranging from material science to bioimaging.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/a9b46f25287e3d0a2fea23954b7dd574d5cea75f

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In Atomic and Molecular Physics, and Optics

1. M. Turner
2. J. Barry
3. J. Schloss
4. C. Hart
5. L. Pham
6. E. Bauch
7. R. Walsworth

In Materials Chemistry

1. M. Turner
2. R. Walsworth
3. C. Hart
4. J. Schloss
5. J. Barry
6. L. Pham
7. E. Bauch

Citations in the corpus

• Sensitivity optimization for NV-diamond magnetometry (2019, methodology): “Because strain shifts the NV- spin resonances (Dolde et al., 2011; Jamonneau et al., 2016; Trusheim and Englund, 2016), gradients and inhomogeneities in strain may dephase the ensemble, limiting T ∗2 .”