TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam

By A. Grabulov, U. Ziese, H. Zandbergen. 2007

174 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/a6bc0ded2c9ac72669503cbc66c871cdfd6a60ed

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In Atomic and Molecular Physics, and Optics

  1. H. Bhadeshia
  2. M.-H. Evans

In Electrical and Electronic Engineering

  1. H. Bhadeshia
  2. M.-H. Evans

In Materials Chemistry

  1. H. Bhadeshia
  2. M.-H. Evans

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