Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

By T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige, Hirofumi Yamada. 2005

365 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/a606dac4c53ad53fa4741ad2442e870fd00ef2dd