Introduction to focused ion beams : instrumentation, theory, techniques, and practice

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Nanoscale organo-mineral reactions of biochars in ferrosol: an investigation using microscopy (2012, background): “Ferrosol”
Sliding wear of nanocrystalline Ni-W: Structural evolution and the apparent breakdown of Archard scaling (2010, methodology): “TEM specimens were prepared using the focused ion beam (FIB) in situ lift-out technique [34] and examined in a JEOL 2010 operated at 200 kV.”
Key computational modeling issues in Integrated Computational Materials Engineering (2013, unknown): “structure datasets [151–162].”
Minimizing damage during FIB sample preparation of soft materials (2012, background): “Focused ion beam (FIB) microscopy has many advantages over traditional transmission electron microscopy (TEM) sample preparation techniques, primarily the ability to target specific areas for characterization (Giannuzzi & Stevie, 2005).”
Fundamentals and advances in magnesium alloy corrosion (2017, background): “Cross sections can be produced mechanically (comprising cutting, grinding and polishing) [175] or be means of focused (Ga) ion beam (FIB) milling [175] or broad (Ar) ion beam (BIB) milling [149,175].”