Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence

By J. Giesecke, M. Schubert, B. Michl, F. Schindler, Wilhelm Warta. 2011

168 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/a528051206b7f8593c01086dba47e0400b6e8c4e