Reliability of normal-state current–voltage characteristics as an indicator of tunnel-junction barrier quality

By B. J. Jönsson-Åkerman, R. Escudero, C. Leighton, S. Kim, I. Schuller, D. Rabson. 2000

139 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/a36c68f8f1179194491e490bd8c7dccb91cd6450