Three-Dimensional Characterization of Microstructure by Electron Back-Scatter Diffraction
By Anthony D. Rollett, Sukbin Lee, R. Campman, G. Rohrer. 2007
160 citations recorded by the source corpus.
Subfields: Materials Chemistry, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/a33b3ca2530e1c3a5553df85dfc943baebd9e8a8
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In Materials Chemistry
- L. Catherine Brinson
- Wing Kam Liu
- D. Qian
- Ted Belytschko
- Christian Lexcellent
- Jacob Fish
- R. Rafiee
- M. Shokrieh
Citations in the corpus
- Grain detection from 2d and 3d EBSD data--specification of the MTEX algorithm. (2011, unknown): “[3].”
- Computational microstructure characterization and reconstruction: Review of the state-of-the-art techniques (2018, methodology): “As an example, the microstructure builder software package [78,187] has been developed to reconstruct 3 D polycrystalline materials (see Fig.”