Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques

By P. Gruber, J. Böhm, Felix Onuseit, A. Wanner, R. Spolenak, Eduard Arzt. 2008

183 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/a256d08523d6dacd3dbb7f6b940d5951ddf082ac